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مهندسی شیمی::
طیفسنجی نور پرتو X
X-ray photo spectroscopy (XPS) 17
FTIR, Raman spectroscopy, XPS, NMR and EPR can be used to study the properties of MOF separation membrane surfaces, including the functional groups or other substances on the surface of the membrane, the contamination of the membrane surface, and whether the MOF-based composite membrane is successfully synthesized.
FTIR, XRD, XPS, XAS, NMR, EPR and HRNPD can be used to accurately characterize the crystal structure of MOF particles, and the characterization results of MOF particles after defect engineering can be obtained as well.
Schematic diagrams of the specific application of spectroscopy: (a) the basic operating principle of attenuated total reflection Fourier transform infrared spectroscopy (ATR-FTIR); (b) ATR-FTIR spectra for MIL-125; (c) FTIR spectra of ZIF-8 and mZIF; (d) FTIR spectra of mZIF powders, TFC, and TFN-mZIF2 membranes; (e) FTIR spectra of UiO- 66, ND-UiO-66, Np-UiO-66 and Ni-UiO-66 samples; (f)XRD patterns of ZIF-8 and mZIF powders; (g) XRD spectra of ZIF-90 and DLA-ZIF-90 particles; (h) PXRD patterns of UiO- 66, ND-UiO-66, NP-UiO-66 and NI-UiO-66 samples; (i) XPS survey spectra of pristine TFC, TFN-mZIF1, and TFN-mZIF3 membranes; (j) XPS spectra of UiO-66
(k) XPS spectra of NP-UiO-66.
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